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Atomic Force Microscopy Facility |
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General Information |
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Atomic force microscopy (AFM) is a relatively new technique used to visualize biomolecules at nanoscale resolution. AFM produces a topographic image of a sample by scanning the surface with a sharp, nanometer scale probe (tip) attached to a flexible cantilever. A laser beam is made incident on the cantilever and deflections in the laser beam as the cantilever scans the surface are sensed by a photodiode and used to reconstruct the image.
Capabilities of AFM
The AFM facility at BME is geared towards biological applications and nanotechnology. AFM technique development and innovative applications form a central focus of the facility. We do:
InstrumentationThe AFM facility is equipped with a multimode AFM with Nanoscope IIIa controller from Digital Instruments (Santa Barbara, CA). This instrument offers high-resolution AFM imaging. The instrument is capable of imaging on several other modes of AFM such as electric force microscopy (EFM), magnetic force microscopy (MFM) and scanning tunneling microscopy (STM). | |
Use of the AFM Facility | |
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To schedule the usage of AFM Facility equipment, please submit your request to Director, Dr. Gunjan Agarwal at agarwal-3@medctr.osu.edu or at (614) 292-3300. All individuals wishing to use the AFM Facility may do so by completing the following documents.
Send completed forms to:
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Last updated: 03/26/2004
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